Measurement technology and process control make all the difference
The production of microsystems in the µ- and sub-µ range places incredibly high demands on the measurement technology used for process monitoring and final inspection.
Assessment and analysis of a wide range of structure sizes and shapes, in combination with a wealth of coatings, make the inspection processes extremely complex and the measuring tools used very costly.
As your reliable partner, IMT can provide you with elements which have been tested and inspected according to specifications.
The following measuring tools are used for measurement and analysis:
- Confocal microscope
- SEM (scanning electron microscope)
- AOI (automatic optical inspection)
- AFM (atomic force microscope)
- Tactile profilometer